Processes for SAP・MSAP
| Application | Properties | Process Name |
|---|---|---|
| Inner-layer Copper / Circuit Formation Pretreatment | Etching agent for roughenining the copper surface prior to circuit formation | NBS II |
| Lamination Pretreatment | Improves adhesion by roughening the copper surface prior to lamination | NBD II |
| Copper Layer Thinning Treatment | Half-etch | HE-500 |
| Direct Lazer Pretreatment | Sulfuric Acid / Hydrogen Peroxide surface treatment agent for direct CO2 lazer processing | NBDL |
| Direct Lazer After-treatment | Sulfuric Acid / Hydrogen Peroxide Etching agent to remove splash and copper burr during copper direct via formation | SPDL |
| From desmear to electroless copper (PTH) processes | High adhesion with low profile processes | FEED |
| DFR Pretreatment | High adhesion with low profile processes | NA (Development) |
| Copper roughening process | NBS II | |
| DFR Removal | Plasma equipment to descum | TAIKAI |
| Copper Pretreatment | Acidic cleaner | PB-242D, PB-268 |
| Via Filling Copper Plating | Via filling process | CU-BRITE VF5 |
| Via filling process | CU-BRITE VL | |
| Via filling process | CU-BRITE VH | |
| * Additional products for other applications also available | ||
| Through-hole Filling Copper Plating | Through-hole filling | CU-BRITE TF II |
| High-Throwing Power Copper Plating | Conformal plating | CU-BRITE VT28 |
| Conformal plating | CU-BRITE 21 | |
| DFR Removal | Non-caustic process | RS-81 |
| SAP Circuit Formation | Selective etching for electroless copper | SAC |
| MSAP Circuit Formation | Selective etching for circuit spacing | FE-830 II |
| SR Pretreatment | Improves adhesion by roughening the copper surface prior to lamination | NBD II |
| SR Residue Removal | Plasma equipment to remove SR residue | TAIKAI |
| Palladium Residue Removal | Cyanide-free palladium removal process | FINELESE |
| Noble Metal Plating | ENEPIG/ENIG | SKYLITE |
| Multilayer / HDI Processes |
Multilayer / HDI Processes
| Application | Properties | Process Name |
|---|---|---|
| Inner-layer Copper / Circuit Formation Pretreatment | Etching agent for roughenining the copper surface prior to circuit formation | NBS II |
| Lamination Pretreatment | Improves adhesion by roughening the copper surface prior to lamination | NBD II |
| Copper Layer Thinning Treatment | Half-etch | HE-500 |
| From desmear to electroless copper | General purpose process | LAIZATRON |
| Desmear | Plasma equipment process to desmear | TAIKAI |
| Copper Pretreatment | Acidic cleaner | PB-242D, PB-268 |
| High-Throwing Power Copper Plating | Conformal plating | CU-BRITE 21 |
| Via Filling Copper Plating | Via filling process | CU-BRITE VF II |
| Via filling process | CU-BRITE MW | |
| Noble Metal Plating | Electrolytic Ni-Au, Electroless Ni-Au | SKYLITE |
FPC / Process for Special Materials
| Application | Properties | Process Name |
|---|---|---|
| Electroless Nickel Seed Layer Formation | Polyimide high adhesion processes | ELFSEED |
| Electroless Plating for Special Materials | Application for COP as well as other materials | AISL |
| Pd-Sn direct plating | Processes especially for polyimide conduction | LAIZATRON DPS |
| Copper Pattern Plating | Flattens top of copper traces and pads | CU-BRITE RF |
| Copper Panel Plating | Optimal for low internal stress, R to R plating among others | CU-BRITE TH-R III |
| Surface Treatment | DFR pre-treatment, gold plating pre-treatment | SA, SI |
| Noble Metal Plating | Electrolytic Ni-Au and Electroless Ni-Au use | SKYLITE |
| Seed Layer Removal | Dissolves sputtered seed metal (Ni-Cr) on polyimide while suppressing copper dissolution | SEEDLON |
Pretreatment Process
| Application | Properties | Process Name |
|---|---|---|
| Immersion Cleaning | Neutral, low foaming, non-chelate | IC-120 |
| Electrolysis Cleaning | Alkaline non-chelate | IC-200RM |
| Etching | Copper and copper-alloy use, immersion type, halogen-free | IC-320 |
| 42 Alloy use, immersion type, halogen-free | IC-313N | |
| Corson alloy use, electrolytic type, halogen-free | CA-40P |
Plating Process
| Application | Properties | Process Name |
|---|---|---|
| Tin Plating (Semi-bright) | Alkane sulfonic acid bath, barrel or rack use | HS-220S |
| Sulfuric acid bath, rack use | RS-26 | |
| Alkane sulfonic acid bath, whisker suppresant effect, barrel or rack use | UT-55 II | |
| Alkane sulfonic acid bath, whisker suppressant, high electrical current density, rack use | UT-55HD II | |
| Tin-Copper Alloy (Semi-bright) | Alkane sulfonic acid bath, non-chelate, high electrical current density, rack use | SE II |
| Alkane sulfonic acid bath, non-chelate, barrel use | SE-BL II | |
| High Throwing Power Process | High throwing power, optimal for high precision parts | SONIX |
IC Lead Frame use, whisker suppression, tin plating process (WHISKER BUSTER)
| Application | Properties | Process Name |
|---|---|---|
| Alkali Electrolysis degreaser | Optimization of WB-300, non-chelate, low foaming | WB-200 |
| Etching | Etching agent used for the Whisker Buster Process Removes the modified and oxidized layer to provide a smooth surface | WB-300 |
| Semi-bright Tin | Alkane sulfonic acid bath Provides a fine, uniform appearance in a wide range of current density areas Excellent throwing power and whisker suppressant | WB-500(HD) |
| Color Shift Prevention | Reduces deterioration in solder wettability Excellent in preventing tarnishing | WB-900 |
Equipment Cleaning
| Application | Properties | Process Name |
|---|---|---|
| Tin, Tin-Lead Alloy | Electrolysis type, low foaming, low sludge, optimum for rackless equipment | IC-461 |
| Tin-Silver Alloy | Immersion type, low smut after stripping | SA-10T |
| Tin-Bismuth Alloy | Electrolysis type, low sludge, optimal for rackless equipment | IC-462 |
| Tin, Tin-Copper Alloy | Immersion type | ST-401NC |
Part Stripping
| Application | Properties | Process Name |
|---|---|---|
| Tin, Tin-Silver Alloy | Immersion type, fluoride-free | SA-421 |
Discoloration Prevention Process
| Application | Properties | Process Name |
|---|---|---|
| Tin, Tin-alloy | More effective than sodium phosphoric acid, prevents solder deterioration | S-50 |
Copper Sulfate Plating
| Application | Properties | Process Name |
|---|---|---|
| Fine Line/Cu Bump | Matte type, maintenance is achievable with one additive, sulfur free | XP-CS |
| Re-wiring/Cu Bump | Flattens the top of bumps, bright type | CU-BRITE BU II |
Tin Plating
| Application | Properties | Process Name |
|---|---|---|
| Tin Bump | Easy bath maintenance | EBASOLDER BU II |
Nickel Plating
| Application | Properties | Process Name |
|---|---|---|
| Barrier Layer | Low stress, great physical properties | BNI |
